Stellenbosch University gets first X-ray microscopy scanner in Africa
X-ray computed tomography (CT), also called X-ray microscopy, is a non-destructive technique for visualising interior features within solid objects and for obtaining digital information on their 3-D geometries and properties. The first nanoCT scanner in Africa will be officially launched on 15 September 2014 at Stellenbosch University's Central Analytical Facilities.